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Fringe 2009: 6th International Workshop on Advanced Optical Metrology epub

by Wolfgang Osten,Malgorzata Kujawinska


Fringe 2009: 6th International Workshop on Advanced Optical Metrology epub

ISBN: 3642030505

ISBN13: 978-3642030505

Author: Wolfgang Osten,Malgorzata Kujawinska

Category: Transportation

Subcategory: Engineering

Language: English

Publisher: Springer; 2009 edition (October 23, 2009)

Pages: 792 pages

ePUB book: 1319 kb

FB2 book: 1506 kb

Rating: 4.1

Votes: 291

Other Formats: txt rtf doc lit





eBook 296,31 €. price for Finland (gross). Topics of particular interest are: New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering).

Goodreads helps you keep track of books you want to read. Start by marking Fringe 2009: 6th International Workshop on Advanced Optical Metrology as Want to Read: Want to Read savin. ant to Read.

Fringe 2009: 6th International Workshop on Advanced Optical Metrology Paperback – 11 September 2009.

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Topic 3: 4D Optical Metrology over a Large Scale Range. Nanomeasuring and Nanopositioning Engineering (invited paper). 390 G. Jäger, E. Manske, T. Hausotte, . J. Büchner Reconstruction of Shape using Gradient Measuring Optical Systems 618 C. Gorecki, S. Bargiel, K. Laszczyk, J. Albero, J. Krezel, M. Kujawinska Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element.

See our disclaimer extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical .

Fringe 2009: 6th International Workshop on Advanced Optical Metrology. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

Fringe 2009 6th International Workshop on Advanced Optical Metrology.

Fringe 2009 - 6th International Workshop on Advanced Optical Metrology Conference. Synthetic aperture digital holography Conference Paper. Automatic Data Acquisition by Omnisol.

Adaptability: problem or solution in Juptner W. and Osten W. M Kujawinska.

We had definitely experienced the revolution connected with introduction of lasers, powerful desktop computers and matrix detectors. However several problems should still be solved  . from book Fringe 2005: The 5th International Workshop on Automatic Processing of Fringe Patterns (p. 4-29). New Challenges for Optical Metrology: Evolution or Revolution. Chapter · January 2006 with 16 Reads. Adaptability: problem or solution in Juptner W.

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.